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15mm AOI detects light sources

  • Family AOI Light Source
  • Size 363 x320 x 140 / 437 x320 x 140 / 515 x320 x 140(unit:mm)
  • LED emission color Red / Green / Blue / white
  • Material Box body (cold-rolled steel plate with spray coating)
  • Application A powerful tool for defect detection in semiconductor silicon wafers, FPCBS, and highly reflective printed materials

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In response to the challenges existing in the detection of defects on highly reflective/transparent surfaces, a continuous multi-angle incident reflective optical structure line light source has been exclusively designed. This solution, by replacing the traditional time-sharing stroboscopic mode, can rapidly detect multiple defects on the surface of complex objects on a single image, significantly enhancing detection efficiency and reducing computational pressure. It provides a high-speed and reliable industrial solution for the front-end detection of PCB/FPCB (defect resolution ≤50μm) This series of products adopts a unique optical design to converge up to 160 degrees of light onto the shooting surface in the quality inspection of the front-end circuit of FPCB boards, which is particularly difficult to detect, such as micro-short, capsulated, and bottom copper. This ensures the richness and uniformity of the incident Angle on the defect area, making it easy for the camera to capture the defect feature information.